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test: begin adding common test harnessing code
This should make tests a bit more convenient to write and debug. Moreover, begin de de-IX-ization of parseExpr. I have, in a local WIP, a parseExpr implemented using a recursive descent algo, it passes all tests, but it unfortunately assembles a faulty zasm. I have to find the expressions that it doesn't parse properly. But before I do that, I prefer to commit these significant improvements I've been making to tests harness in parallel of this development.
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@ -26,6 +26,18 @@ parseExpr:
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pop de
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ret
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; Same as parseExpr, but preserves IX and puts result in DE. This is a
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; transitionary routine and will replace parseExpr when everyone has jumped
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; ship.
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parseExprDE:
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push ix
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push hl
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call _parseExpr
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push ix \ pop de
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pop hl
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pop ix
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ret
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_parseExpr:
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ld de, exprTbl
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.loop:
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@ -6,9 +6,15 @@
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* until it halts. The return code is the value of the register A at halt time.
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*/
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static void iowr_stderr(uint8_t val)
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{
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fputc(val, stderr);
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}
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int main()
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{
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Machine *m = emul_init();
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m->iowr[0] = iowr_stderr;
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// read stdin in mem
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int i = 0;
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int c = getchar();
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@ -22,6 +28,7 @@ int main()
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return 1;
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}
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emul_loop();
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if (m->cpu.R1.wr.HL)
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return m->cpu.R1.br.A;
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}
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@ -11,7 +11,7 @@ APPS="${BASE}/apps"
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chk() {
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echo "Running test $1"
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if ! ${ZASM} "${KERNEL}" "${APPS}" < $1 | ${RUNBIN}; then
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if ! ${ZASM} "${KERNEL}" "${APPS}" common.asm < $1 | ${RUNBIN}; then
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echo "failed with code ${PIPESTATUS[1]}"
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exit 1
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fi
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@ -22,7 +22,7 @@ if [ ! -z $1 ]; then
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exit 0
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fi
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for fn in *.asm; do
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for fn in test_*.asm; do
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chk "${fn}"
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done
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@ -1,5 +1,6 @@
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jp test
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.inc "ascii.h"
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.inc "core.asm"
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.inc "str.asm"
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.inc "lib/util.asm"
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@ -8,6 +9,9 @@ jp test
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.equ EXPR_PARSE parseLiteral
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.inc "lib/expr.asm"
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.inc "basic/parse.asm"
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.inc "lib/fmt.asm"
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.inc "stdio.asm"
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.inc "common.asm"
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test:
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ld sp, 0xffff
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@ -55,21 +59,21 @@ testParseThruth:
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.true:
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call parseTruth
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jp nz, fail
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call assertZ
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or a
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jp z, fail
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call assertNZ
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jp nexttest
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.false:
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call parseTruth
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jp nz, fail
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call assertZ
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or a
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jp nz, fail
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call assertZ
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jp nexttest
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.error:
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call parseTruth
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jp z, fail
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call assertNZ
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jp nexttest
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.t1: .db "42", 0
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@ -88,17 +92,4 @@ testParseThruth:
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.f6: .db "2<=1", 0
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.e1: .db "foo", 0
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testNum: .db 1
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nexttest:
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ld a, (testNum)
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inc a
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ld (testNum), a
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ret
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fail:
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ld a, (testNum)
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halt
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; used as RAM
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sandbox:
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STDIO_RAMSTART:
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@ -5,8 +5,14 @@
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jp test
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.inc "ascii.h"
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.inc "core.asm"
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.inc "lib/ari.asm"
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.inc "lib/fmt.asm"
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.inc "stdio.asm"
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.inc "common.asm"
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dummyLabel:
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testNum: .db 1
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.equ dummyLabel 0x42
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@ -37,37 +43,25 @@ test:
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call nexttest
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; Test that .equ can override label
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ld a, 0x42
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ld de, 0x42
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ld hl, dummyLabel
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cp l
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jp nz, fail
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call assertEQW
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call nexttest
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; test that "@" is updated by a .org directive
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ld hl, AFTER_ORG
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ld de, 0x1234
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or a ; clear carry
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sbc hl, de
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jp nz, fail
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call assertEQW
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call nexttest
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; test that AND affects the Z flag
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ld a, 0x69
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and 0x80
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jp nz, fail
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call assertZ
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call nexttest
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; success
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xor a
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halt
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nexttest:
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ld a, (testNum)
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inc a
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ld (testNum), a
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ret
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fail:
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ld a, (testNum)
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halt
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STDIO_RAMSTART:
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@ -9,10 +9,12 @@
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jp test
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.inc "ascii.h"
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.inc "core.asm"
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.inc "str.asm"
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.inc "lib/util.asm"
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.inc "lib/ari.asm"
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.inc "lib/fmt.asm"
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.inc "zasm/util.asm"
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.inc "zasm/const.asm"
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.inc "lib/parse.asm"
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@ -21,6 +23,9 @@ jp test
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.inc "zasm/symbol.asm"
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.equ EXPR_PARSE parseNumberOrSymbol
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.inc "lib/expr.asm"
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.equ STDIO_RAMSTART SYM_RAMEND
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.inc "stdio.asm"
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.inc "common.asm"
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; Pretend that we aren't in first pass
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zasmIsFirstPass:
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@ -29,8 +34,6 @@ zasmIsFirstPass:
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zasmGetPC:
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ret
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testNum: .db 1
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s1: .db "2+2", 0
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s2: .db "0x4001+0x22", 0
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s3: .db "FOO+BAR", 0
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@ -44,29 +47,22 @@ sBAR: .db "BAR", 0
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test:
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ld sp, 0xffff
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; New-style tests
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;call testParseExpr
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; Old-style tests, not touching them now.
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ld hl, s1
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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or a
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jp nz, fail
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ld a, l
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cp 4
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 4
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call assertEQW
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call nexttest
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ld hl, s2
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x23
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 0x4023
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call assertEQW
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call nexttest
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; before the next test, let's set up FOO and BAR symbols
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@ -81,55 +77,33 @@ test:
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jp nz, fail
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ld hl, s3
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x20
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 0x4020
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call assertEQW
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call nexttest
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ld hl, s4
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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or a
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jp nz, fail
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ld a, l
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cp 0x60
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 0x60
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call assertEQW
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call nexttest
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ld hl, s5
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x3f
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jp nz, fail
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ld a, l
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cp 0xfd
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 0x3ffd
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call assertEQW
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call nexttest
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ld hl, s6
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x80
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jp nz, fail
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call parseExprDE
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call assertZ
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ld hl, 0x4080
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call assertEQW
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call nexttest
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; New-style tests
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call testParseExpr
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; success
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xor a
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halt
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@ -151,20 +125,18 @@ testParseExpr:
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call .testEQ
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ld iy, .t8
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call .testEQ
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ld iy, .t9
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call .testEQ
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ret
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.testEQ:
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push iy \ pop hl
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inc hl \ inc hl
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call parseExpr
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jp nz, fail
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push ix \ pop de
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ld a, e
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cp (iy)
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jp nz, fail
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ld a, d
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cp (iy+1)
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jp nz, fail
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call parseExprDE
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call assertZ
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ld l, (iy)
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ld h, (iy+1)
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call assertEQW
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jp nexttest
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.t1:
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@ -191,13 +163,6 @@ testParseExpr:
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.t8:
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.dw 0xffff
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.db "-1", 0
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nexttest:
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ld a, (testNum)
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inc a
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ld (testNum), a
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ret
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fail:
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ld a, (testNum)
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halt
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.t9:
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.dw 10
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.db "2*3+4", 0
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