collapseos/tests/unit/test_expr.asm

156 lines
2.3 KiB
NASM

.equ RAMSTART 0x4000
.equ ZASM_REG_MAXCNT 0xff
.equ ZASM_LREG_MAXCNT 0x40
.equ ZASM_REG_BUFSZ 0x1000
.equ ZASM_LREG_BUFSZ 0x200
; declare DIREC_LASTVAL manually so that we don't have to include directive.asm
.equ DIREC_LASTVAL RAMSTART
jp test
.inc "ascii.h"
.inc "core.asm"
.inc "str.asm"
.inc "lib/util.asm"
.inc "lib/ari.asm"
.inc "lib/fmt.asm"
.inc "zasm/util.asm"
.inc "zasm/const.asm"
.inc "lib/parse.asm"
.inc "zasm/parse.asm"
.equ SYM_RAMSTART DIREC_LASTVAL+2
.inc "zasm/symbol.asm"
.equ EXPR_PARSE parseNumberOrSymbol
.inc "lib/expr.asm"
.equ STDIO_RAMSTART SYM_RAMEND
.inc "stdio.asm"
.inc "common.asm"
; Pretend that we aren't in first pass
zasmIsFirstPass:
jp unsetZ
zasmGetPC:
ret
sFOO: .db "FOO", 0
sBAR: .db "BAR", 0
test:
ld sp, 0xffff
; before testing begins, let's set up FOO and BAR symbols
call symInit
ld hl, sFOO
ld de, 0x4000
call symRegisterGlobal
jp nz, fail
ld hl, sBAR
ld de, 0x20
call symRegisterGlobal
jp nz, fail
call testParseExpr
call testSPOnFail
; success
xor a
halt
testParseExpr:
ld hl, .alltests
ld ix, .test
jp testList
.test:
push hl \ pop iy
inc hl \ inc hl
call parseExpr
call assertZ
ld l, (iy)
ld h, (iy+1)
jp assertEQW
.t1:
.dw 7
.db "42/6", 0
.t2:
.dw 1
.db "7%3", 0
.t3:
.dw 0x0907
.db "0x99f7&0x0f0f", 0
.t4:
.dw 0x9fff
.db "0x99f7|0x0f0f", 0
.t5:
.dw 0x96f8
.db "0x99f7^0x0f0f", 0
.t6:
.dw 0x133e
.db "0x99f7}3", 0
.t7:
.dw 0xcfb8
.db "0x99f7{3", 0
.t8:
.dw 0xffff
.db "-1", 0
.t9:
.dw 10
.db "2*3+4", 0
; There was this untested regression during the replacement of find-and-subst
; parseExpr to the recursive descent one. It was time consuming to find. Here
; it goes, here it stays.
.t10:
.dw '-'+1
.db "'-'+1", 0
.t11:
.dw 0x4023
.db "0x4001+0x22", 0
.t12:
.dw 0x4020
.db "FOO+BAR", 0
.t13:
.dw 0x60
.db "BAR*3", 0
.t14:
.dw 0x3ffd
.db "FOO-3", 0
.t15:
.dw 0x4080
.db "FOO+BAR*4", 0
; "0" is a special case, let's test it
.t16:
.dw 0
.db "0", 0
; Another one that caused troubles
.t17:
.dw 123
.db "0+123", 0
.alltests:
.dw .t1, .t2, .t3, .t4, .t5, .t6, .t7, .t8, .t9, .t10, .t11, .t12
.dw .t13, .t14, .t15, .t16, .t17, 0
; Ensure that stack is balanced on failure
testSPOnFail:
ld (testSP), sp
ld hl, .sFail
call parseExpr
call assertNZ
call assertSP
jp nexttest
.sFail: .db "1+abc123", 0