collapseos/tools/tests/unit/test_parse.asm

137 lines
1.6 KiB
NASM

jp test
.inc "core.asm"
.inc "lib/util.asm"
.inc "lib/parse.asm"
.inc "lib/args.asm"
zasmGetPC:
ret
testNum: .db 1
test:
ld hl, 0xffff
ld sp, hl
call testParseHex
call testParseHexPair
call testParseArgs
; success
xor a
halt
testParseHex:
ld a, '8'
call parseHex
jp c, fail
cp 8
jp nz, fail
call nexttest
ld a, 'e'
call parseHex
jp c, fail
cp 0xe
jp nz, fail
call nexttest
ld a, 'x'
call parseHex
jp nc, fail
call nexttest
ret
testParseHexPair:
ld hl, .s99
call parseHexPair
jp c, fail
cp 0x99
jp nz, fail
call nexttest
ld hl, .saB
call parseHexPair
jp c, fail
cp 0xab
jp nz, fail
call nexttest
ld hl, .sFoo
call parseHexPair
jp nc, fail
call nexttest
ret
.sFoo: .db "Foo", 0
.saB: .db "aB", 0
.s99: .db "99", 0
testParseArgs:
ld hl, .t1+6
ld de, .t1
ld iy, .t1+3
call .testargs
ld hl, .t2+6
ld de, .t2
ld iy, .t2+3
call .testargs
ld hl, .t3+6
ld de, .t3
ld iy, .t3+3
call .testargs
ret
; HL and DE must be set, and IY must point to expected results in IX
.testargs:
ld ix, sandbox
call parseArgs
jp nz, fail
ld a, (ix)
cp (iy)
jp nz, fail
ld a, (ix+1)
cp (iy+1)
jp nz, fail
ld a, (ix+2)
cp (iy+2)
jp nz, fail
jp nexttest
; Test data format: 3 bytes specs, 3 bytes expected (IX), then the arg string.
; Empty args with empty specs
.t1:
.db 0b0000, 0b0000, 0b0000
.db 0, 0, 0
.db 0
; One arg, one byte spec
.t2:
.db 0b0001, 0b0000, 0b0000
.db 0xe4, 0, 0
.db "e4", 0
; 3 args, 3 bytes spec
.t3:
.db 0b0001, 0b0001, 0b0001
.db 0xe4, 0xab, 0x99
.db "e4 ab 99", 0
nexttest:
ld a, (testNum)
inc a
ld (testNum), a
ret
fail:
ld a, (testNum)
halt
; used as RAM
sandbox: