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145b48efb7
A new app to stress test the SD card driver. Also, accompanying this commit, changes solidifying the SD card driver so that stress tests actually pass :)
28 lines
664 B
NASM
28 lines
664 B
NASM
; sdct
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;
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; We want to test reading and writing random data in random sequences of
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; sectors. Collapse OS doesn't have a random number generator, so we'll simply
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; rely on initial SRAM value, which tend is random enough for our purpose.
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;
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; How it works is simple. From its designated RAMSTART, it calls PutC until it
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; reaches the end of RAM (0xffff). Then, it starts over and this time it reads
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; every byte and compares.
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;
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; If there's an error, prints out where.
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;
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; *** Requirements ***
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; sdcPutC
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; sdcGetC
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; printstr
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; printHexPair
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;
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; *** Includes ***
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#include "user.h"
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.org USER_CODE
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.equ SDCT_RAMSTART USER_RAMSTART
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jp sdctMain
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#include "sdct/main.asm"
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