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collapseos/tools/tests/unit/test_expr.asm
2019-11-23 14:56:23 -05:00

204 lines
2.6 KiB
NASM

.equ RAMSTART 0x4000
.equ ZASM_REG_MAXCNT 0xff
.equ ZASM_LREG_MAXCNT 0x40
.equ ZASM_REG_BUFSZ 0x1000
.equ ZASM_LREG_BUFSZ 0x200
; declare DIREC_LASTVAL manually so that we don't have to include directive.asm
.equ DIREC_LASTVAL RAMSTART
jp test
.inc "core.asm"
.inc "str.asm"
.inc "lib/util.asm"
.inc "lib/ari.asm"
.inc "zasm/util.asm"
.inc "zasm/const.asm"
.inc "lib/parse.asm"
.inc "zasm/parse.asm"
.equ SYM_RAMSTART DIREC_LASTVAL+2
.inc "zasm/symbol.asm"
.equ EXPR_PARSE parseNumberOrSymbol
.inc "lib/expr.asm"
; Pretend that we aren't in first pass
zasmIsFirstPass:
jp unsetZ
zasmGetPC:
ret
testNum: .db 1
s1: .db "2+2", 0
s2: .db "0x4001+0x22", 0
s3: .db "FOO+BAR", 0
s4: .db "BAR*3", 0
s5: .db "FOO-3", 0
s6: .db "FOO+BAR*4", 0
sFOO: .db "FOO", 0
sBAR: .db "BAR", 0
test:
ld sp, 0xffff
; Old-style tests, not touching them now.
ld hl, s1
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
or a
jp nz, fail
ld a, l
cp 4
jp nz, fail
call nexttest
ld hl, s2
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x23
jp nz, fail
call nexttest
; before the next test, let's set up FOO and BAR symbols
call symInit
ld hl, sFOO
ld de, 0x4000
call symRegisterGlobal
jp nz, fail
ld hl, sBAR
ld de, 0x20
call symRegisterGlobal
jp nz, fail
ld hl, s3
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x20
jp nz, fail
call nexttest
ld hl, s4
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
or a
jp nz, fail
ld a, l
cp 0x60
jp nz, fail
call nexttest
ld hl, s5
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x3f
jp nz, fail
ld a, l
cp 0xfd
jp nz, fail
call nexttest
ld hl, s6
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x80
jp nz, fail
call nexttest
; New-style tests
call testParseExpr
; success
xor a
halt
testParseExpr:
ld iy, .t1
call .testEQ
ld iy, .t2
call .testEQ
ld iy, .t3
call .testEQ
ld iy, .t4
call .testEQ
ld iy, .t5
call .testEQ
ld iy, .t6
call .testEQ
ld iy, .t7
call .testEQ
ld iy, .t8
call .testEQ
ret
.testEQ:
push iy \ pop hl
inc hl \ inc hl
call parseExpr
jp nz, fail
push ix \ pop de
ld a, e
cp (iy)
jp nz, fail
ld a, d
cp (iy+1)
jp nz, fail
jp nexttest
.t1:
.dw 7
.db "42/6", 0
.t2:
.dw 1
.db "7%3", 0
.t3:
.dw 0x0907
.db "0x99f7&0x0f0f", 0
.t4:
.dw 0x9fff
.db "0x99f7|0x0f0f", 0
.t5:
.dw 0x96f8
.db "0x99f7^0x0f0f", 0
.t6:
.dw 0x133e
.db "0x99f7}3", 0
.t7:
.dw 0xcfb8
.db "0x99f7{3", 0
.t8:
.dw 0xffff
.db "-1", 0
nexttest:
ld a, (testNum)
inc a
ld (testNum), a
ret
fail:
ld a, (testNum)
halt