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253674ea05
Also, make tests run in a *BSD environment
134 lines
1.7 KiB
NASM
134 lines
1.7 KiB
NASM
.equ RAMSTART 0x4000
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jp test
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#include "core.asm"
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#include "parse.asm"
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#include "lib/util.asm"
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#include "zasm/util.asm"
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#include "zasm/const.asm"
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#include "lib/parse.asm"
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#include "zasm/parse.asm"
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.equ SYM_RAMSTART RAMSTART
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#include "zasm/symbol.asm"
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#include "zasm/expr.asm"
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; Pretend that we aren't in first pass
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zasmIsFirstPass:
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jp unsetZ
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zasmGetPC:
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ret
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testNum: .db 1
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s1: .db "2+2", 0
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s2: .db "0x4001+0x22", 0
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s3: .db "FOO+BAR", 0
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s4: .db "BAR*3", 0
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s5: .db "FOO-3", 0
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s6: .db "FOO+BAR*4", 0
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sFOO: .db "FOO", 0
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sBAR: .db "BAR", 0
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test:
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ld hl, 0xffff
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ld sp, hl
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ld hl, s1
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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or a
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jp nz, fail
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ld a, l
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cp 4
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jp nz, fail
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call nexttest
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ld hl, s2
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x23
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jp nz, fail
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call nexttest
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; before the next test, let's set up FOO and BAR symbols
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call symInit
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ld hl, sFOO
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ld de, 0x4000
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call symRegister
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jp nz, fail
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ld hl, sBAR
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ld de, 0x20
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call symRegister
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jp nz, fail
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ld hl, s3
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x20
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jp nz, fail
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call nexttest
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ld hl, s4
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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or a
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jp nz, fail
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ld a, l
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cp 0x60
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jp nz, fail
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call nexttest
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ld hl, s5
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x3f
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jp nz, fail
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ld a, l
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cp 0xfd
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jp nz, fail
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call nexttest
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ld hl, s6
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call parseExpr
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jp nz, fail
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push ix \ pop hl
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ld a, h
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cp 0x40
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jp nz, fail
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ld a, l
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cp 0x80
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jp nz, fail
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call nexttest
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; success
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xor a
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halt
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nexttest:
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ld a, (testNum)
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inc a
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ld (testNum), a
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ret
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fail:
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ld a, (testNum)
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halt
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