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collapseos/tools/tests/unit/test_parse.asm

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jp test
.inc "core.asm"
.inc "lib/util.asm"
.inc "lib/parse.asm"
.inc "lib/args.asm"
zasmGetPC:
ret
testNum: .db 1
test:
ld hl, 0xffff
ld sp, hl
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call testParseHex
call testParseHexPair
call testParseArgs
; success
xor a
halt
testParseHex:
ld a, '8'
call parseHex
jp c, fail
cp 8
jp nz, fail
call nexttest
ld a, 'e'
call parseHex
jp c, fail
cp 0xe
jp nz, fail
call nexttest
ld a, 'x'
call parseHex
jp nc, fail
call nexttest
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ret
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testParseHexPair:
ld hl, .s99
call parseHexPair
jp c, fail
cp 0x99
jp nz, fail
call nexttest
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ld hl, .saB
call parseHexPair
jp c, fail
cp 0xab
jp nz, fail
call nexttest
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ld hl, .sFoo
call parseHexPair
jp nc, fail
call nexttest
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ret
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.sFoo: .db "Foo", 0
.saB: .db "aB", 0
.s99: .db "99", 0
testParseArgs:
ld hl, .t1+6
ld de, .t1
ld iy, .t1+3
call .testargs
ld hl, .t2+6
ld de, .t2
ld iy, .t2+3
call .testargs
ld hl, .t3+6
ld de, .t3
ld iy, .t3+3
call .testargs
ret
; HL and DE must be set, and IY must point to expected results in IX
.testargs:
ld ix, sandbox
call parseArgs
jp nz, fail
ld a, (ix)
cp (iy)
jp nz, fail
ld a, (ix+1)
cp (iy+1)
jp nz, fail
ld a, (ix+2)
cp (iy+2)
jp nz, fail
jp nexttest
; Test data format: 3 bytes specs, 3 bytes expected (IX), then the arg string.
; Empty args with empty specs
.t1:
.db 0b0000, 0b0000, 0b0000
.db 0, 0, 0
.db 0
; One arg, one byte spec
.t2:
.db 0b0001, 0b0000, 0b0000
.db 0xe4, 0, 0
.db "e4", 0
; 3 args, 3 bytes spec
.t3:
.db 0b0001, 0b0001, 0b0001
.db 0xe4, 0xab, 0x99
.db "e4 ab 99", 0
nexttest:
ld a, (testNum)
inc a
ld (testNum), a
ret
fail:
ld a, (testNum)
halt
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; used as RAM
sandbox: