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collapseos/tools/tests/unit/test_expr.asm

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.equ RAMSTART 0x4000
.equ ZASM_REG_MAXCNT 0xff
.equ ZASM_LREG_MAXCNT 0x40
.equ ZASM_REG_BUFSZ 0x1000
.equ ZASM_LREG_BUFSZ 0x200
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; declare DIREC_LASTVAL manually so that we don't have to include directive.asm
.equ DIREC_LASTVAL RAMSTART
jp test
.inc "core.asm"
.inc "str.asm"
.inc "lib/util.asm"
.inc "lib/ari.asm"
.inc "zasm/util.asm"
.inc "zasm/const.asm"
.inc "lib/parse.asm"
.inc "zasm/parse.asm"
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.equ SYM_RAMSTART DIREC_LASTVAL+2
.inc "zasm/symbol.asm"
.equ EXPR_PARSE parseNumberOrSymbol
.inc "lib/expr.asm"
; Pretend that we aren't in first pass
zasmIsFirstPass:
jp unsetZ
zasmGetPC:
ret
testNum: .db 1
s1: .db "2+2", 0
s2: .db "0x4001+0x22", 0
s3: .db "FOO+BAR", 0
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s4: .db "BAR*3", 0
s5: .db "FOO-3", 0
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s6: .db "FOO+BAR*4", 0
sFOO: .db "FOO", 0
sBAR: .db "BAR", 0
test:
ld sp, 0xffff
; Old-style tests, not touching them now.
ld hl, s1
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
or a
jp nz, fail
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ld a, l
cp 4
jp nz, fail
call nexttest
ld hl, s2
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
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ld a, l
cp 0x23
jp nz, fail
call nexttest
; before the next test, let's set up FOO and BAR symbols
call symInit
ld hl, sFOO
ld de, 0x4000
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call symRegisterGlobal
jp nz, fail
ld hl, sBAR
ld de, 0x20
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call symRegisterGlobal
jp nz, fail
ld hl, s3
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
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ld a, l
cp 0x20
jp nz, fail
call nexttest
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ld hl, s4
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
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or a
jp nz, fail
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ld a, l
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cp 0x60
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jp nz, fail
call nexttest
ld hl, s5
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
cp 0x3f
jp nz, fail
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ld a, l
cp 0xfd
jp nz, fail
call nexttest
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ld hl, s6
call parseExpr
jp nz, fail
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push ix \ pop hl
ld a, h
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cp 0x40
jp nz, fail
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ld a, l
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cp 0x80
jp nz, fail
call nexttest
; New-style tests
call testParseExpr
; success
xor a
halt
testParseExpr:
ld iy, .t1
call .testEQ
ld iy, .t2
call .testEQ
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ld iy, .t3
call .testEQ
ld iy, .t4
call .testEQ
ld iy, .t5
call .testEQ
ld iy, .t6
call .testEQ
ld iy, .t7
call .testEQ
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ld iy, .t8
call .testEQ
ret
.testEQ:
push iy \ pop hl
inc hl \ inc hl
call parseExpr
jp nz, fail
push ix \ pop de
ld a, e
cp (iy)
jp nz, fail
ld a, d
cp (iy+1)
jp nz, fail
jp nexttest
.t1:
.dw 7
.db "42/6", 0
.t2:
.dw 1
.db "7%3", 0
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.t3:
.dw 0x0907
.db "0x99f7&0x0f0f", 0
.t4:
.dw 0x9fff
.db "0x99f7|0x0f0f", 0
.t5:
.dw 0x96f8
.db "0x99f7^0x0f0f", 0
.t6:
.dw 0x133e
.db "0x99f7}3", 0
.t7:
.dw 0xcfb8
.db "0x99f7{3", 0
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.t8:
.dw 0xffff
.db "-1", 0
nexttest:
ld a, (testNum)
inc a
ld (testNum), a
ret
fail:
ld a, (testNum)
halt